Journal of Applied Informatics

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SHuvalov V. B.

Degree	Ph. D. (Eng.), Associate Professor, Intelligent Control Systems Department, National Research Nuclear University MEPhI
E-mail	vbshuvalov@yandex.ru
Location	Moscow
Articles	On one way of the analysis of structure of a multidimensional accurate logic regulator The way of the analysis of structure of a multidimensional accurate logic regulator for revealing repeating, contradicting and supplementing each other condition-action rules is discussed. The appropriate software based on this method is described. Read more... Collecting and processing historical data in automated information systems This paper deals with the issues of the automated systems historical data accumulation as well as data processing and analysis for scheduling and maintenance of the system. A method of collection of historical data, providing the possibility to store detailed information about all the changes of the stored information is suggested, the main advantages and disadvantages of this method are described. The authors provide some methods of processing and analyzing of the collected data applicable in different stages of a system development, as well as in the course of its operation and maintenance. Read more... Building optimal test sets for checking complex digital devices The basic principles for combining test checks of individual modules constituting the digital device into a single test program are described. Association of checks is conducted under incomplete information concerning reactions of the faulty device. Properties of optimum ordered sequence of checks in the test are formulated. Heuristic checks ordering algorithms are offered. Read more... Building optimal test sets for checking complex digital devices The basic principles for combining test checks of individual modules constituting the digital de‑ vice into a single test program are described. Association of checks is conducted under incomplete information concerning reactions of the faulty device. Properties of optimum ordered sequence of checks in the test are formulated. Heuristic checks ordering algorithms are offered. Read more... Organization of control of digital devices based on the assessment of the reliability of their functioning The performance reliability indicators characterize the operability of the “test object – test tool” system and significantly depend on the performance reliability parameters of the testing equipment. Consequently, they can serve as criteria for selecting the necessary tools at the design stage of digital devices and assessing their effectiveness. The paper proposes quantitative criteria for assessing the effectiveness of the hardware testing method based on the assumption that a digital device performs a certain generalizing function, the values of which depend on a set of quantities reflecting individual operating modes of the device, and can be classified as correct only if there are no errors in the operating device. To quantitatively assess the performance reliability of the equipment, it is proposed to use the probability value that the digital device as a whole will function error-free provided that there is no detectable fault. The calculated evaluation value allows you to select the best of several possible test circuit options or synthesize a new one. Cases of organizing test procedures based on various principles and their combinations are considered. An optimization problem of placing test circuits in a tested device is formulated and a technique for solving it under certain restrictions is proposed. A distinctive feature of the proposed approach is the elimination of the need to use the values of conditional probabilities of detected faults, on the use of which known methods are built, although their practical receipt is very labor-intensive. The operation of the method of rational placement of control circuits is illustrated by the example of a control signal block. Read more...